Name
S44: Reliability, Diagnostics and Fault Analysis
Date
Thursday, October 15, 2020
Time
9:35 AM - 10:05 AM
Description


Presentations and Authors:

1. Impact of Mission Profile Dynamics on Accuracy of Thermal Stress Modeling in PV Inverters (Ariya Sangwongwanich, Huai Wang, Frede Blaabjerg)

2. A Calculation Method of Analytical DC Fault Current in MMC-HVDC Grid including Current-Limiting Devices (Song Tang, Guanlong Jia, Chenghao Zhang, Min Chen)

3. A Simple Diagnosis Approach for Multiple IGBT Faults in Cascaded H-Bridge Multilevel Converters (Dong Xie, Xinglai Ge)

4. Separation of Bond-Wire and Solder Layer Failure Modes in IGBT Power Modules (Wenzhao Liu, Dao Zhou, Michael Hartmann, Francesco Iannuzzo, Frede Blaabjerg)

5. Case Temperature Monitoring-Based Online Condition Monitoring of SiC MOSFET Power Modules using a Radial Basis Function Network (Cameron Entzminger, Wei Qiao, Liyan Qu)

6. Co-Optimization of Boost Converter Reliability and Volumetric Power Density using Genetic Algorithm (Lee Gill, Jason C. Neely, Lee J. Rashkin, Jack D. Flicker, Robert J. Kaplar)

7. Preserving Converter Lifetime by Active Thermal Boundary Control (Patrick T. Lewis, Brandon M. Grainger)

8. Condition Monitoring of DC-Link Capacitors in Grid-Tied Solar Inverters using Data-Driven Techniques (Vahe Seferian, Ali Bazzi, Hazem Hajj)

9. An IGBT Open-Circuit Fault Diagnosis Method for Grid-Tied T-Type Three-Level Inverters (Zhan Li, Bohui Zhao, Xin Zhang, Hao Ma)

Category
Sessions (On-Demand with Live Q&A Sessions)